Wojciech Maly

Professor Emeritus – ECE
Department Electrical and Computer Engineering
Office 2118 Hamerschlag Hall
Telephone (412)-268-6637
Fax (412)-268-1374
Website http://www.ece.cmu.edu/~maly/

Research Interests

Circuit and Process Design for IC Manufacturability

Owing to random events of a diverse nature, only a fraction of fabricated integrated circuits (ICs) meet required specifications. The objective of this research is to study and model all major physical phenomena that cause IC manufacturing failures. These models are then applied to develop design and process modification, minimizing chances of IC malfunctions.

Silicon Implementation Strategy Advisor

Recent progress in integrated circuit (IC) technology allows for integration of the entire electronic system in a single silicon chip. The strategy of the integration involves a number of complex trade-offs. The objective of this project is to identify and quantify these trade-offs, as well as develop a prototype computer tool enabling navigation in the complex system integration design space.

Design and Test for Defect Observability

Effective design for manufacturability methodology must use adequate information about process-generated defects. The objective of this project is to study new VLSI design and test methodologies that enable better defect observability via interpretation of test results. New current signature and DFT of embedded memories-based methods are employed to achieve the defect observability objectives.

In the News

  • Wojciech Maly Wins Aristotle Award for Outstanding Teaching
  •  Wojciech  Maly

    Carnegie Mellon, 1983


    Computer-aided design and manufacturing of VLSICs


    PhD, 1975
    Electrical and Computer Engineering
    Polish Academy of Sciences

    MS, 1970
    Electrical and Computer Engineering
    Technical University of Warsaw