With technology scaling, reliability issues triggered by multiple sources are increasing rapidly. Thus, reliability is one of the most important design goals, and it needs to be considered at every design layer, from technology at the low end, up to the system layer.
The first part of the course focuses on existing reliability issues, reliability modeling approaches, and the design for reliability at current technology node. The second part explores application specific reliability issues in medical devices, automotive and aerospace control systems, power systems, communication systems, etc. Finally, the course explores the reliability dimension in emerging and non-silicon technologies, from carbon nano-tubes and molecular electronics to microfluidic biochips and synthetic biology. This is a graduate-level, research-oriented course. It is aimed at a wide audience: students from electrical and computer engineering, computer science, biomedical engineering, physics, etc. In addition to attending lectures, students are expected to read and review papers and come up with critiques to current solutions or propose new solutions to open problems. The course will also include work on a semester long project. Several thrusts will be addressed during the entire semester and will be available for further study within projects: • Sources of faults, errors and failures in current and future technology • Modeling and analysis of reliability at different levels of abstraction • Design techniques for reliability at different levels of abstraction • Interplay between power, performance, cost and reliability • Safety, security and reliability • Reliability, testing and verification • Application-specific approaches to reliability • Reliability issues in emerging technologies