Wangyang (Lucas) Zhang, PhD Sr Member of Technical Staff Cadence Design Systems 246 Alpha Drive Pittsburgh, PA 15238

I received my B.S. and M.S. degrees from Department of Computer Science and Technology, Tsinghua University, in 2006 and 2008 respectively. I received my PhD degree from ECE Dept in CMU in 2012. My research interest focuses on statistical methods for computer-aided design of integrated circuits under process variations.

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Publications

1. Wangyang Zhang, Amith Singhee, Jinjun Xiong, Peter Habitz, Amol Joshi, Chandu Visweswariah and James Sundquist, "A dynamic method for efficient random mismatch characterization of standard cells," International Conference on Computer Aided Design (ICCAD), 2012.
2. Xin Li, Wangyang Zhang, Fa Wang, Shupeng Sun and Chenjie Gu, "Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion," International Conference on Computer Aided Design (ICCAD), 2012.
3. Xin Li, Wangyang Zhang and Fa Wang, "Large-scale statistical performance modeling of analog and mixed-signal circuits," IEEE Custom Integrated Circuits Conference (CICC), 2012.
4. Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane Boning, Emrah Acar, Frank Liu and Rob Rutenbar, "Spatial variation decomposition via sparse regression," International Conference on IC Design and Technology (ICICDT), 2012.
5. Wangyang Zhang, Xin Li, Frank Liu, Emrah Acar, Rob Rutenbar and Ronald Blanton, "Virtual probe: a statistical framework for low-cost silicon characterization of nanoscale integrated circuits," IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems (TCAD), vol. 30, no. 12, pp. 1814-1827, Dec. 2011.
6. Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane Boning, and Rob Rutenbar, "Toward efficient spatial variation decomposition via sparse regression," International Conference on Computer Aided Design (ICCAD), pp. 162-169, 2011.
7. Hsiu-Ming (Sherman) Chang, Kwang-Ting (Tim) Cheng, Wangyang Zhang, Xin Li and Kenneth Butler, "Test cost reduction through performance prediction using virtual probe," International Test Conference (ITC), 2011.
8. Wenjian Yu, Chao Hu and Wangyang Zhang, "Parallel statistical capacitance extraction of on-Chip interconnects with an improved geometric variation model," Asia and South Pacific Design Automation Conference (ASPDAC), pp. 67-72, 2011.
9. Wangyang Zhang, Xin Li, Emrah Acar, Frank Liu and Rob Rutenbar, "Multi-wafer virtual probe: minimum-cost variation characterization by exploring wafer-to-wafer correlation," International Conference on Computer Aided Design (ICCAD), pp. 47-54, 2010.
10. Wangyang Zhang, Xin Li and Rob Rutenbar, "Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference," Design Automation Conference (DAC), pp. 262-267, 2010. (Best paper award)
11. Wangyang Zhang, Tsung-Hao Chen, Ming-Yuan Ting and Xin Li, "Toward efficient large scale performance modeling of integrated circuits via multi-mode/multi-corner sparse regression," Design Automation Conference (DAC), pp. 897-902, 2010.
12. Wenjian Yu, Chao Hu and Wangyang Zhang, "Variational capacitance extraction of on-chip interconnects based on continuous surface model," Design Automation Conference (DAC), pp. 758-763, 2009.
13. Wangyang Zhang, Wenjian Yu, Zeyi Wang, Zhiping Yu, Rong Jiang and Jinjun Xiong, " An efficient method for chip-level statistical capacitance extraction considering process variations with spatial correlation," Design, Automation & Test in Europe (DATE), pp. 580-585, 2008.
14. Wangyang Zhang, Wenjian Yu, Hong Liu, Zeyi Wang, "Hierarchical h-adaptive computation of VLSI interconnect capacitance with QMM acceleration," International Conference on Solid-State and Integrated Circuit Technology (ICSICT), pp. 1438-1440, 2006.