in Technical Proceedings of the NSTI Nanotechnology Conference and Trade Show (Nanotech 2006) (NSTI), pp. 546-549, Vol. 3., May 7-11, 2006, Boston, MA.
Mechanical Properties Measurements of 0.35-?m BiCMOS MEMS Structures
J. Liu, G. Fedder, S. Sassolini and N. Sarkar
ABSTRACT: