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We combine our MEMS synthesis and test capabilities into a synthesis-for-test environment. A microresonator design
meeting a variety of specifications is synthesized. The susceptibility of this design is then measured using our MEMS
contamination analyzer. The nature of each defective microresonator is determined and the deviation from nominal
performance is correlated to the bounds and design constraints used in the synthesis process. Feedback from this
analysis is formulated into additional design constraints for the synthesis tool with the object of minimizing the
impact of spot contaminations. Re-synthesis of the same designs using these additional constraints indicates that a
certain class of catastrophic and parametric faults can be reduced by 25% without sacrificing performance.
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Full paper not available from outside CMU
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