CMU MEMS Laboratory Publication Abstract

 

in IEEE Journal of Solid-State Circuits, Volume 26, No. 3, March 1991.
Rapid Yield Estimation as a Computer Aid for Analog Circuit Design
T. Mukherjee and R. Carley
ABSTRACT:
A rapid yield estimation methodology that aids the analog circuit designer in making design trade-offs that improve yield is presented. This methodology is based on using hierarchical evaluation of analysis equations, rather than simulation, to predict circuit performance. The new analog rapid yield estimation (ARYE) method has been used to predict the yield of two-stage op amps, and has been incorporated into the Carnegie Mellon University (CMU) analog design system (ACACIA). An example of how ARYE allows analog designers to quickly explore the impact of design changes on yield will be presented. The primary goal of ARYE is to make numerous early predictions of parametric yield economical for the analog circuit designer.
© 1991 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Full paper (PDF) (opens in new window).


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