CMU MEMS Laboratory Publication List

 

 
1. A. Kolpekwar, T. Jiang and S. Blanton, CARAMEL: Contamination And Reliability Analysis of MicroElectromechanical Layout, in IEEE/ASME Journal of Microelectromechanical Systems, Volume 8, Issue 3, pp. 309-318, September 1999.
[Abstract] | Full paper (PDF)
2. A. Kolpekwar, C. Kellen and S. Blanton, MEMS Fault Model Generation Using CARAMEL, in Proceedings of the IEEE International Test Conference (ITC '98), pp. 557-566, October 18-23, 1998, Washington, D.C..
[Abstract] | Full paper (PDF)
3. A. Kolpekwar, S. Blanton and D. Woodilla, Failure Modes for Stiction in Surface-Micromachined MEMS, in Proceedings of the IEEE International Test Conference (ITC '98), pp. 551-556, October 18-23, 1998, Washington, D.C..
[Abstract] | Full paper (PDF)
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