CMU MEMS Laboratory Publication List

 

 
1. A. Kolpekwar, T. Jiang and S. Blanton, CARAMEL: Contamination And Reliability Analysis of MicroElectromechanical Layout, in IEEE/ASME Journal of Microelectromechanical Systems, Volume 8, Issue 3, pp. 309-318, September 1999.
[Abstract] | Full paper (PDF)
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