CMU MEMS Laboratory Publication List

 

 
1. A. Kolpekwar, T. Jiang and S. Blanton, CARAMEL: Contamination And Reliability Analysis of MicroElectromechanical Layout, in IEEE/ASME Journal of Microelectromechanical Systems, Volume 8, Issue 3, pp. 309-318, September 1999.
[Abstract] | Full paper (PDF)
Your request returns 1 result.


This page was generated in 1.542064 seconds at 10:30:16 am EST on 30 Jan 2015.

overview | projects | people | publications | intranet | resources         © 1998-2009  Carnegie Mellon