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B. Baidya and T. Mukherjee, Layout Verification for Mixed-Domain Integrated MEMS, in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, pp. 563-577, Vol. 24, No. 4, April 2005.
[Abstract] | Full paper (PDF) |
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B. Baidya, Layout Verification for Mixed-domain Integrated MEMS, Ph.D. Thesis, August 2003, Carnegie Mellon University, Pittsburgh, PA.
[Abstract] | Full paper (PDF) |
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B. Baidya and T. Mukherjee, Layout Verification by Extraction for Micro Total Analysis Systems, in Technical Proceedings of the Sixth International Conference on Modeling and Simulation of Microsystems Semiconductors, Sensors and Actuators (MSM '03), pp. 262-265, February 24-26, 2003, San Francisco, California.
[Abstract] | Full paper not available from outside CMU |
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B. Baidya and T. Mukherjee, Extraction and LVS for Mixed-domain Integrated MEMS Layouts, in Technical Digest of the ACM/IEEE International Conference on Computer Aided Design (ICCAD '02), pp. 361-366, November 10-14, 2002, San Jose, California.
[Abstract] | Full paper (PDF) |
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B. Baidya, T. Mukherjee and J. Hoburg, Dispersion Modeling in Microfluidic Channels for System-Level Optimization, in Technical Proceedings of the Fifth International Conference on Modeling and Simulation of Microsystems (MSM '02), pp. 182-185, April 22-25, 2002, San Juan, Puerto Rico.
[Abstract] | Full paper not available from outside CMU |
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B. Baidya, S. K. Gupta and T. Mukherjee, An extraction-based verification methodology for MEMS, in Journal of Microelectromechanical Systems, Volume 11, Issue 1, pp. 2-11, February 2002.
[Abstract] | Full paper (PDF) |
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B. Baidya and T. Mukherjee, Layout Extraction for Integrated Electronics and MEMS Devices, in Technical Digest of the 11th International Conference on Solid-State Sensors and Actuators (TRANSDUCERS '01), pp. 280-283, June 10-14, 2001, Munich, Germany.
[Abstract] | Full paper not available from outside CMU |
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B. Baidya and T. Mukherjee, Challenges in CMOS-MEMS Extraction, in Technical Proceedings of the Fourth International Conference on Modeling and Simulation of Microsystems (MSM '01), pp. 108-111, March 19-21, 2001, Hilton Head, SC, USA.
[Abstract] | Full paper not available from outside CMU |
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B. Baidya, K. He and T. Mukherjee, Layout Verification and Correction of CMOS-MEMS Layouts, in Technical Proceedings of the Fourth International Conference on Modeling and Simulation of Microsystems (MSM '01), pp. 426-429, March 19-21, 2001, Hilton Head, SC, USA.
[Abstract] | Full paper not available from outside CMU |
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B. Baidya, MEMS Extraction, M.S. Thesis, May 1999, Carnegie Mellon University, Pittsburgh, PA.
[Abstract] | Full paper (PDF) |
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H. Lakdawala, B. Baidya, T. Mukherjee and G. Fedder, Intelligent Automatic Meshing Of Multilayer CMOS Micromachined Structures For Finite Element Analysis, in Technical Proceedings of the Second International Conference on Modeling and Simulation of Microsystems (MSM '99), pp. 297-300, April 19-21, 1999, San Juan, PR, USA.
[Abstract] | Full paper not available from outside CMU |
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B. Baidya, S. K. Gupta and T. Mukherjee, MEMS Component Extraction, in Technical Proceedings of the Second International Conference on Modeling and Simulation of Microsystems (MSM '99), pp. 143-146, April 19-21, 1999, San Juan, PR, USA.
[Abstract] | Full paper not available from outside CMU |
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B. Baidya, S. K. Gupta and T. Mukherjee, Feature-Recognition for MEMS Extraction, in CD-ROM Proceedings of 1998 ASME DETC Design Automation Conference (DETC '98), September 13-16, 1998, Atlanta, GA, USA.
[Abstract] | Full paper not available from outside CMU |
Your request returns 13 results.
