CMU MEMS Laboratory Publication List

 

 
1. N. Deb and S. Blanton, Multi-modal built-in self-test for symmetric microsystems, in Proceedings of the 22nd IEEE VLSI Test Symposium (VTS '04), pp. 139-147, April 25-29, 2004, Napa, CA.
[Abstract] | Full paper (PDF)
2. N. Deb and S. Blanton, Built-in Self Test of CMOS-MEMS Accelerometers, in Proceedings of the 2002 IEEE International Test Conference (ITC '02), pp. 1075-1084, October 7-10, 2002, Baltimore, MD.
[Abstract] | Full paper (PDF)
3. N. Deb, S. V. Iyer, T. Mukherjee and S. Blanton, MEMS Resonator Synthesis for Defect Reduction, in Journal of Modeling and Simulation of Microsystems, Vol. 2, No. 1, pp. 11-20, June 2001.
[Abstract] | Full paper not available from outside CMU
4. N. Deb and S. Blanton, Analysis of Failure Sources in Surface-Micromachined MEMS, in Proceedings of the 2000 IEEE International Test Conference (ITC '00), pp. 739-749, October 3-5, 2000, Atlantic City, NJ.
[Abstract] | Full paper (PDF)
5. N. Deb and S. Blanton, Built-In Self Test of MEMS Accelerometers, in to appear in IEEE/ASME Journal of Microelectromechanical Systems, Volume 8, Issue 3, December 1999.
[Abstract] | Full paper (PDF)
6. T. Mukherjee, G. Fedder and S. Blanton, Hierarchical Design and Test of Integrated Microsystems, in IEEE Design & Test Magazine, pp. 18-27, October 1999.
[Abstract] | Full paper (PDF)
7. A. Kolpekwar, T. Jiang and S. Blanton, CARAMEL: Contamination And Reliability Analysis of MicroElectromechanical Layout, in IEEE/ASME Journal of Microelectromechanical Systems, Volume 8, Issue 3, pp. 309-318, September 1999.
[Abstract] | Full paper (PDF)
8. N. Deb, S. V. Iyer, T. Mukherjee and S. Blanton, MEMS Resonator Synthesis for Testability, in Design, Test and Microfabrication of MEMS/MOEMS (DTM '99), pp. 58-69, Mar. 30-Apr. 1, 1999, Paris, France.
[Abstract] | Full paper not available from outside CMU
9. A. Kolpekwar, C. Kellen and S. Blanton, MEMS Fault Model Generation Using CARAMEL, in Proceedings of the IEEE International Test Conference (ITC '98), pp. 557-566, October 18-23, 1998, Washington, D.C..
[Abstract] | Full paper (PDF)
10. A. Kolpekwar, S. Blanton and D. Woodilla, Failure Modes for Stiction in Surface-Micromachined MEMS, in Proceedings of the IEEE International Test Conference (ITC '98), pp. 551-556, October 18-23, 1998, Washington, D.C..
[Abstract] | Full paper (PDF)
11. S. Blanton, G. Fedder and T. Mukherjee, Hierarchical Design & Test of MEMS, MST News: International Newsletter on Microsystems and MEMS, pp. 28-31, vol. 1998, no. 1, March 1998.
[Abstract] | Full paper not available from outside CMU
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