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N. Deb and S. Blanton, Multi-modal built-in self-test for symmetric microsystems, in Proceedings of the 22nd IEEE VLSI Test Symposium (VTS '04), pp. 139-147, April 25-29, 2004, Napa, CA.
[Abstract] | Full paper (PDF) |
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N. Deb and S. Blanton, Built-in Self Test of CMOS-MEMS Accelerometers, in Proceedings of the 2002 IEEE International Test Conference (ITC '02), pp. 1075-1084, October 7-10, 2002, Baltimore, MD.
[Abstract] | Full paper (PDF) |
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N. Deb, S. V. Iyer, T. Mukherjee and S. Blanton, MEMS Resonator Synthesis for Defect Reduction, in Journal of Modeling and Simulation of Microsystems, Vol. 2, No. 1, pp. 11-20, June 2001.
[Abstract] | Full paper not available from outside CMU |
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4. |
N. Deb and S. Blanton, Analysis of Failure Sources in Surface-Micromachined MEMS, in Proceedings of the 2000 IEEE International Test Conference (ITC '00), pp. 739-749, October 3-5, 2000, Atlantic City, NJ.
[Abstract] | Full paper (PDF) |
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N. Deb and S. Blanton, Built-In Self Test of MEMS Accelerometers, in to appear in IEEE/ASME Journal of Microelectromechanical Systems, Volume 8, Issue 3, December 1999.
[Abstract] | Full paper (PDF) |
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T. Mukherjee, G. Fedder and S. Blanton, Hierarchical Design and Test of Integrated Microsystems, in IEEE Design & Test Magazine, pp. 18-27, October 1999.
[Abstract] | Full paper (PDF) |
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A. Kolpekwar, T. Jiang and S. Blanton, CARAMEL: Contamination And Reliability Analysis of MicroElectromechanical Layout, in IEEE/ASME Journal of Microelectromechanical Systems, Volume 8, Issue 3, pp. 309-318, September 1999.
[Abstract] | Full paper (PDF) |
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N. Deb, S. V. Iyer, T. Mukherjee and S. Blanton, MEMS Resonator Synthesis for Testability, in Design, Test and Microfabrication of MEMS/MOEMS (DTM '99), pp. 58-69, Mar. 30-Apr. 1, 1999, Paris, France.
[Abstract] | Full paper not available from outside CMU |
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A. Kolpekwar, C. Kellen and S. Blanton, MEMS Fault Model Generation Using CARAMEL, in Proceedings of the IEEE International Test Conference (ITC '98), pp. 557-566, October 18-23, 1998, Washington, D.C..
[Abstract] | Full paper (PDF) |
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A. Kolpekwar, S. Blanton and D. Woodilla, Failure Modes for Stiction in Surface-Micromachined MEMS, in Proceedings of the IEEE International Test Conference (ITC '98), pp. 551-556, October 18-23, 1998, Washington, D.C..
[Abstract] | Full paper (PDF) |
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11. |
S. Blanton, G. Fedder and T. Mukherjee, Hierarchical Design & Test of MEMS, MST News: International Newsletter on Microsystems and MEMS, pp. 28-31, vol. 1998, no. 1, March 1998.
[Abstract] | Full paper not available from outside CMU |
Your request returns 11 results.
