Electrical & Computer Engineering     |     Carnegie Mellon

Wednesday, October 15 , 12:00-1:00 p.m. HH-1112


TM Mak
Intel Corporation

Is CMOS More Reliable With Scaling?

There is a general assumption that electronics are more reliable than mechanical parts. Manufacturing technology has improved and so has the reliability of most electronics products. With scaling to even smaller dimensions every two years, what does it mean to reliability? What are the challenges ahead of us in this area? Can we assume business as usual? Will some of the conventional fault tolerant techniques help us here? This talk will begin with an overview of the factors that influence reliability and then analyze the impact that scaling has on these factors.

TM Mak is the industrial liaison for GSRC test research. He has been with Intel for 19.5 years and is now conducting research in DFT, test methodology area. His research interest span defect based testing, high performance IO testing, functional test and DFT, fault tolerant and on-line testing and many others.