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+====== Improving the Reliability of Chip-Off Forensic Analysis of NAND Flash Memory Devices ======
+Wednesday March 8, 2017\\
+Location: CIC Panther Hollow Room\\
+Time: 4:30PM\\
+**Aya Fukami (CMU & National Police Agency of Japan)**\\
+=====Abstract=====
+Digital forensics investigators often need to extract data from
+physically damaged devices.  In such cases, investigators turn to
+chip-off forensic analysis, which uses a thermal-based procedure to
+physically remove the NAND flash memory chip from the device, so that
+raw data can be directly extracted from the chip.  The first half of
+this talk will present issues related to chip-off analysis, examining
+the errors introduced in NAND flash memory in the time between device
+seizure and data extraction, as well as the errors introduced by the
+thermal-based chip removal process itself.  In order to mitigate the
+various errors observed during the chip-off analysis process, we
+evaluated the effectiveness of read-retry, a hardware-based mechanism
+implemented in modern NAND flash memory chips. The second half of this
+talk will explain how investigators can leverage read-retry mechanisms
+in order to improve the reliability of chip-off forensic analysis.
+=====Bio=====
+Aya Fukami is a visiting researcher at Carnegie Mellon University
+CyLab.  She is also a digital forensic scientist at the National
+Police Agency of Japan, where she has been conducting low-level data
+recovery from digital devices for criminal investigations.  Her
+current research interest is in NAND Flash memory reliability,
+especially how temperature affects the device-level operation.  She
+received a BSc in Computer Science from Kitakyushu University, and an
+MSc in Electrical Engineering from George Washington University,
+respectively.
+\\
+\\
+**[[seminars| Back to the seminar page]]**

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