The research in Advanced Chip Testing Laboratory (ACTL) is focused on developing data-mining techniques for improving the operation, design, manufacturing and testing of integrated systems. This paradigm rests on the fact that integrated systems may fail due to various reasons, such as manufacturing imperfection, wear-out failure, and hacker attacks.


Active projects in ACTL are centered on analyzing operation data and test data to ensure reliable chip operation, improve chip design and fabrication to maximize yield, and customize test to prevent bad chips from escaping to the next level of integration. They can be divided into four categories:

  • Design for manufacturability (DFM)
  • Statistical learning in chip (SLIC)
  • Enhancement of chip-test methodologies
  • Development of chip-diagnosis techniques