April 10, 2013
A team of Carnegie Mellon ECE researchers and their collaborators have won the IEEE Donald O. Pederson Best Paper Award for their paper, "Virtual Probe: A Statistical Framework for Low-Cost Silicon Characterization of Nanoscale Integrated Circuits." The award, sponsored by the IEEE Council on Electronic Design Automation, recognizes the best paper published in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, based on general quality, originality, contributions, subject matter and timeliness. Nominated articles must be published during the two calendar years preceding the award.
The paper was part of ECE alumnus Wangyang Zhang's Ph.D. work with his advisors, Assistant Professor Xin Li and Adjunct Professor Rob Rutenbar. Collaborators included CMU ECE Professor Shawn Blanton, and IBM's Frank Liu and Emrah Acar. Their paper describes a new methodology for modeling spatial variations of silicon wafers from a minimum set of measurement data.
The authors will accept the award, which includes a plaque and cash prize, in June at the IEEE/ACM Design Automation Conference in Austin, Texas.