July 7, 2011
The paper "Concurrent Autonomous Self-Test for Uncore Components in System-on-Chips," co-authored by ECE Assistant Professor Onur Mutlu, has been selected as the best paper published in the 28th IEEE VLSI Test Symposium (VTS) Proceedings in 2010. The selection was made by the VTS program committee from 45 papers published in the proceedings. Co-authors of the paper include Yanjing Li, a Ph.D. student at Stanford who previously interned with Mutlu; Intel's Donald Gardner; and Subhasish Mitra, a professor at Stanford. The paper focuses on enhancing the reliable operation of multicore systems. It introduces low-cost and low-hardware-overhead methods for performing hardware fault detection and diagnosis in shared hardware resources of a multicore system while the system is under operation. For more information, click here.
Assistant Professor of ECE Onur Mutlu.