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The design and manufacturing of the state-of-the-art integrated circuits (ICs) have become extremely challenging due to ever-increasing complexity and miniaturization. ICs must be designed to obtain best possible performance (e.g., speed) while minimizing power dissipation and must be manufactured at economically acceptable yield levels. Professor Strojwas research addresses both the design and manufacturing of ULSICs.
This research is aimed at analysis and design of ULSICs that take into account the technology capabilities and manufacturing fluctuations. The specific projects include:
Research in this area covers the diagnosis of reasons responsible for yield loss, such as defects and excessive process fluctuations. The specific projects include: