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2012

March

Shawn Blanton at ITC 2011

 

Shawn Blanton poses with Steely McBean (mascot of the Pittsburgh Steelers professional football team) while recruiting at the 2012 National Society of Black Engineers convention in Pittsburgh, Pennsylvania.

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March

Wing Chiu at ITC 2011Shawn Blanton gave an Invited talk at the 2012 China Semiconductor Technology International Conference (CSTIC) in Shanghai. Title of his talk: “Improving Design, Manufacturing and Even Test Through Test-Data Mining”



2011

September

Shawn Blanton at ITC 2011

 

Shawn Blanton serves as 2011 Program Chair for the International Test Conference, held at Disneyland in Anaheim, California.

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September

Wing Chiu at ITC 2011Wing Chiu (Jason) Tam won the TTTC's E. J. McCluskey Doctoral Thesis award during the International Test Conference 2011 in Anaheim, California. The Award serves the purpose to promote the most impactful doctoral student work, to provide the students with the exposure to the community and the prospective employers, and to support interaction between academia and industry in the field of test technology. Jason's dissertation, “Physically Aware Analysis of Systematic Defects in ICs,” addresses the problem of information extraction from IC failure diagnosis data in order to provide feedback to designers for product yield improvement.


August

Mitchell MartinMitchell Martin is awarded an AISES Intel Scholarship.AISES

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June

ICMAT 2011Shawn Blanton gave an Invited talk at the 2011 International Conference on Materials for Advanced Technologies (ICMAT) in Singapore. Title of his talk: “Improving Design, Manufacturing and Even Test Through Test-Data Mining”

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June

Wing Chui (Jason) TamWing Chiu (Jason) Tam earned first place in the ACM Student Research Competition (SRC) held during the Design Automation Conference in San Diego. Sponsored by Microsoft Research, the SRC offers a unique forum for students to present their original research before a panel of judges and attendees. The competition begins with a poster session to determine the semifinalists that go on to deliver short presentations for a panel of judges. As the first prize winner in the graduate student category, Tam will compete in the ACM Grand Finals next June.

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April

goup pictureWing Chiu (Jason) Tam earned first place in the semi-final competition for the E. J. McCluskey Doctoral Thesis Award at the 2011 VLSI Test Symposium held in Dana Point, CA. Sponsored by the Test Technology Technical Council (TTTC), this award is given to the winner of a two-stage contest with semi-finals held at TTTC-sponsored events. The winners of the semi-finals, determined by jurys composed of industrial experts, will compete against each other in the finals, held at the 2011 International Test Conference in Anaheim, CA. This major Award is named after Prof. Edward J. McCluskey, a key educator and mentor in the fields of test technology, logic design, and reliability.

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April

Semiconductor Research CorporationMitchell MartinSRC Global Research Collaboration awards an IBM/GRC Fellowship to Mitchell Martin.


April

NSF logoMitchell MartinMitchell Martin is named a recipient of the prestigious NSF Fellowship.

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April

Ford Foundation LogoMitchell MartinMitchell Martin is named a recipient of the prestigious Ford Foundation Fellowship.



2010

December

ISEDShawn Blanton gave a Plenary talk at the 2010 International Symposium on Electronic System Design (ISED) in Bhubaneswar, India. Title of his talk: “Using Test and Diagnosis to Enable Tomorrow’s Robust Systems”

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November

cover imageShawn Blanton featured in Diversity / Careers in Engineering & Information Technology Magazine, Winter 2010 / Spring 2011 Issue. Read the article.

 

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November

Xiaochun YuCurrent and former members of ACTL give five talks at the 2010 International Test Conference in Austin Texas. Pictured is Xiaochun Yu, presenter of ACTL work in Session #22.


November

ICCADShawn Blanton gives an invited talk at the 2010 IEEE/ACM Workshop on Variability Modeling and Characterization in San Jose, CA, on the topic of “Test Data Mining”. This workshop is held in conjunction with the 2010 International Conference on Computer-Aided Design (ICCAD).

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November

Blanton and CohnShawn Blanton named the 2011 Program chair of the International Test Conference (ITC). Dr. Blanton is pictured here with 2010 ITC invited speaker Dr. John Cohn, IBM Fellow, CMU Alum and star of the Discovery Channel show, “The Colony”.


June

Shawn Blanton VLSI 2010Shawn Blanton, Director of CSSI, speaks at the VLSI Design and Education Center’s 2010 Design-to-Test Symposium held at the University of Tokyo.

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June

Mike WangMike Wang has been awarded an Intel Summer Fellowship for conducting machine-learning research for application to Intel fabrication tool maintenance.


May

FCRPECE Assistant Research Professor Xin Li, Professors Rob Rutenbar and Shawn Blanton received Inventor Recognition Award from Focus Center Research Program (FCRP). This award is conferred in recognition of their inventive contributions to develop the Virtual Probe (VP) methodology for low-cost silicon testing and characterization of integrated circuits.

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May

Jason TamJason Tam at the 2010 IEEE VLSI Test Symposium in Santa Cruz, CA. Jason had a well-attended presentation on his latest work involving the characterizing the impact of imperfect lithography on critical area analysis.