Sounil Biswas

Contact Information
Affiliation
: Center
for Silicon System Implementation [CSSI]
Department
: Electrical and Computer Engineering
School
: Carnegie Mellon University
Address :
5000 Forbes Avenue,
Carnegie Mellon University,
Department of Electrical and Computer Engineering,
HH# 2131,
Pittsburgh, PA 15213.
Phone No.
: 412-268-5234
Fax
: 412-268-1374
Email
: sbiswas@andrew.cmu.edu
Personal Details
Date of Birth :
May 25th, 1979
Place of Birth : Calcutta,
India
Citizenship :
Indian
Present Residence : Pittsburgh,
USA
Academic Background
I have been born and brought up in Calcutta,
India. I have undergone
basic schooling there. Then I went for undergraduate college to Indian Institute of Technology, Kanpur [IITK]. I had undergraduate schooling from July
1998 till May 2002 in the department
of Electrical Engineering. I
completed undergraduate schooling with 3rd position in the department and a
cumulative performance index of 9.5 (out of 10.0). During my undergraduate
studies I have received several academic excellency
awards for outstanding academic performance during different academic years
including best student performace award in the
department for the academic year of 2000-2001. During the academic year of
2001-2002 I also completed Bachelor's research under the supervision of Prof. Baquer Mazhari to publish a paper at the 16th International Conference
on VLSI Design and Second International Conference on Embedded Systems Design
(see publication 1).
After finishing undergraduate studies I joined the
department of Electrical Engineering
at Carnegie Mellon University in Pittsburgh,
Pennsylvania (USA)
in persuance of the degree of Master of Science
(M.S.) extending to the degree of Doctor of Philosopsy
(Ph.D.) with full scholarship. I completed my M.S. degree in May 2004.
Presently I am a doctoral candidate at Carnegie
Mellon University
under Prof. R. D. (Shawn) Blanton.
Research Interest
1.
Digital test generation and fault
simulation.
2. Delay Test
3. Analog and mixed signal test.
4. Test cost reduction and test ecomonics.
Publications
- S.
Biswas and R. D. Blanton, “Statistical Test Compaction using Binary
Decision Trees,” IEEE Design
& Test of Computers: Special Issue on Process Variation and Stochastic
Design and Test, vol. 23, no. 6, pp. 452 – 462 , Jun. 2006.
- S. Biswas, P. Li, R. D.
Blanton, L. T. Pileggi, "Specification Test
Compaction for Analog Circuits and MEMS," Proc. of Design,
Automation and Test Conf. in Europe, pp. 164-169, Mar. 2005.
- S. Biswas, K.N. Dwarakanath
and R. D. (Shawn) Blanton, "Generalized Sensitization using Fault Tuples", Proc. of VLSI Test Symposium, pp.
297-303, Apr. 2004.
- S.
Biswas, “Generalized Sensitization Using Fault Tuples,” Master’s Thesis, Carnegie
Mellon University,
Apr. 2004.
- S. Biswas and B. Mazhari, "A Path Sensitization Technique for
Testing of Switched Capacitor Circuits", Proc. of the 16th Intl.
Conf. on VLSI Design, pp. 30-35, Jan. 2003.
Last modified: Tue Dec 09 15:18:15 EDT
2003